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| abstract | |
| X Ray Emission Spectroscopic Study of Sealing of Sulphuric Acid Anodic Films on Aluminium: Part II Effect of sealant | |
| Technique developed in prev. paper is used to study effect of 3 different sealants, incl. Ni acetate & triethanolamine. Depth profiles are obt'd. 3 refs. | |
| X Ray Emission Spectroscopic Study of Sulphuric Acid Sealing of Anodic Films on Aluminium: Part III Effect of electrolyte temperature | |
| Pt III focusses on sealing temp. effect and shows wt. loss and gain and depth profiles are constructed. The structure of the anodic film and the chemistry of its formation & dissol'n are proposed. 17 refs. | |
| X Ray Emission Spectroscopic Study of the Sealing of Sulphuric Acid Anodised Films on Aluminium 1. Technique & application to anodic films | |
| Title study follows wt. gain & thickness growth. Some chemical sectioning allows depth profiles to be constructed. Anodising times to 2880 mins are used. 9 refs. | |
| X Ray Thickness Tester Combines Accuracy with Convenience | |
| Use of XRF is surveyed, with brief description of principles, a table of substrate-coatings to which the method can be applied and a graph showing the accuracy attainable. | |
| X-ray absorption spectroscopy study of the local structure of heavy metal ions incorporated into electrodeposited nickel oxide films | |
| JES | |
| X-ray absorption study of electrochemically grown oxide films on Al-Cr sputtered alloys. I. Ex situ studies | |
| JES Oxides grown electrochem. in borate buffer soln. on surface of sputter-deposited AlCr alloy films were studied by X-ray absorption near edge structure (XANES). Measurements were made in air immediately following polarization in soln. Oxides were examined with X-ray photoelectron spectroscopy. Effects of alloy composition and thickness as well as applied potential were studied. Cr(VI) was found in oxides if applied potential was sufficiently high. Cr(VI) was enriched at interface with electrolyte and proportion of Cr(VI) in oxide was higher for alloy films containing more Cr. Cr(VI) in oxides could be reversibly reduced to Cr(III) and reoxidized to Cr(VI) by subsequent potentiostatic treatments in soln. | |
| X-Ray Coating Thickness Measurement Device | |
| X-Ray Diffraction & Thermal Wave Analysis of Primary Recrystallisation of Electrodeposited Copper | |
| JAE Mechanistic study at room temp. of "recovery" of electrodeposited copper ("age softening") which drives recrystallisation. Thermal diffusivity and resistivity are reported as is "stored energy release". 29 refs. | |
| X-ray diffraction analysis of residual stresses in springs. | |
| Study of stress in automotive engine valve springs and effects on these of manufacturing & finishing parameters. | |
| X-ray diffraction analysis of the structure and residual stresses of W/Cu multilayers. | |
| SURF | |
| X-Ray Diffraction and Scanning Electron Microscopy Studies of Calcium Carbonate Electrodeposited on a Steel Surface | |
| X-ray diffraction and tensometric investigation of the surfaces of steel specimens after grinding with cubic boron nitride wheels | |
| X-ray diffraction characterisation of expanded austenite and ferrite in plasma nitrided stainless steels. | |
| SFEN | |
| X-Ray Diffraction Characterization of Ion-Implanted Austenitic Stainless Steel. | |
| SURF | |
| X-Ray Diffraction for Measurement of Degree of Alloying of Hot Dip Galvanised Coatings | |
